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Your search for Manufacturer: Applied Materials, Inc
found:
  • 11 Listing(s) with a matching description:
 Offered (box) or Wanted (coins)  Item ID  Short Description Product Type / Details # Price Notes
Make Model
   
199832

Applied Materials  

P5000 

List all items of this typeChemical Vapor Deposition Equipment - Other

in Chemical Vapor Deposition Equipment

1  
P5000 Deposition Tool:
4 Chambers
CVD standard Chambers 
SNIT
199833

Applied Materials  

P5000 

List all items of this typeChemical Vapor Deposition Equipment - Other

in Chemical Vapor Deposition Equipment

1  
P5000 Deposition Tool:
3 Chambers
A,B and D, CVD universal Chambers 
SNIT
199834

Applied Materials  

P5000 

List all items of this typeChemical Vapor Deposition Equipment - Other

in Chemical Vapor Deposition Equipment

1  
P5000 Deposition Tool:
3 Chambers
A,B Teos CVD universal Chambers 
C,D Etch chambers Mark2
202357

Applied Materials  

P5000 

List all items of this typeChemical Vapor Deposition Equipment - Other

in Chemical Vapor Deposition Equipment

1   N*
202358

Applied Materials  

P5000 

List all items of this typeChemical Vapor Deposition Equipment - Other

in Chemical Vapor Deposition Equipment

1   N*
187743

Applied Materials  

AMAT eMax CT chamber  

List all items of this typeCluster Plasma Tools - Oxide

in Cluster Plasma Tools

1   F*
AMAT eMax CT chamber :
AMAT eMax CT chamberSold via STOREL Contract
187747

Applied Materials  

AMAT eMax CT plus chamber 

List all items of this typeCluster Plasma Tools - Oxide

in Cluster Plasma Tools

1   F*
AMAT eMax CT plus chamber:
AMAT eMax CT plus chamber manufactured 12/2002
163973

Applied Materials  

Compass Pro 300 

List all items of this typePatterned Wafer Inspection

in Surface Inspection

1   F*
AMAT COMPASS PRO 300mm:
Darkfield Defect Inspection,
2x 300mm Load Ports Asyst SMIF-300FL
163974

Applied Materials  

Compass Pro 300 

List all items of this typePatterned Wafer Inspection

in Surface Inspection

1   F*
AMAT COMPASS PRO 300mm:
Darkfield Defect Inspection,
2x 300mm Load Ports Asyst SMIF-300FL
163975

Applied Materials  

Compass Pro 300 

List all items of this typePatterned Wafer Inspection

in Surface Inspection

1   F*
AMAT COMPASS PRO 300mm:
Darkfield Defect Inspection
2x 300mm Load Ports Asyst SMIF-300FL
Tool already disassembled.
179175

Applied Materials  

Compass 200mm 

List all items of this typePatterned Wafer Inspection

in Surface Inspection

1   F*
AMAT Compass 200mm:

COMPASS PRO* – INCREASING SENSITIVITY AND THROUGHPUT

FOR 100NM CHALLENGES

Addressing the increasing need for higher sensitivity at

higher throughputs, the CompassPro introduces new features

targeted at grainy layers, complex devices such as combined

logic and memory, and more accurate die-to-die precision,

resolution and defect reporting. Additionally, CompassPro

optimizes performance on copper and low-k with predefined

recipes. CompassPro patterned wafer inspection

technology helps our customers to actively engineer high

yield in the shortest possible time. The “Pro-active”

approach provides an un-rivaled solution set for patterned

wafer inspection in the nanometer era.

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.